|
Apr 26, 2024
|
|
|
|
MET 248 - Scanning Electron Microscopy and X-ray Microanalysis Credits: 3 Lecture Contact Hours: 2 Lab Contact Hours: 2 Description: This course introduces the fundamentals of Scanning Electron Microscopy (SEM) and X-ray Microanalysis used for materials characterization and failure analysis. Topics include microscopy systems and components, safety and maintenance, applications in fractography and materials characterization and failure analysis.
Prerequisites: MET 153 or consent of department. Corequisites: None. Recommended: None.
Course Category: Occupational This Course is Typically Offered: Winter Only Check Course Availability
Add to My Catalog (opens a new window)
|
|