May 19, 2022  
2021-2022 Catalog 
    
2021-2022 Catalog [ARCHIVED CATALOG]

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MET 248 - Scanning Electron Microscopy and X-ray Microanalysis


Credits: 3
Lecture Contact Hours: 2
Lab Contact Hours: 2
Description: This course introduces the fundamentals of Scanning Electron Microscopy (SEM) and X-ray Microanalysis used for materials characterization and failure analysis. Topics include microscopy systems and components, safety and maintenance, applications in fractography and materials characterization and failure analysis.

Prerequisites: MET 153  or consent of department.
Corequisites: None.
Recommended: None.

Course Category: Occupational
This Course is Typically Offered: Winter Only
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