MET 248 - Scanning Electron Microscopy and X-ray Microanalysis

Credits: 3
Lecture Contact Hours: 2
Lab Contact Hours: 2
Description: This course introduces the fundamentals of Scanning Electron Microscopy (SEM) and X-ray Microanalysis used for materials characterization and failure analysis. Topics include microscopy systems and components, safety and maintenance, applications in fractography and materials characterization and failure analysis.

Prerequisites: MET 153 or consent of department.
Corequisites: None.
Recommended: None.

Course Category: Occupational
This Course is Typically Offered: Winter Only
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Course Competencies

Investigate the application of Scanning Electron Microscopy in the field of materials science.
Investigate the application of X-ray microanalysis in the field of materials science.
Operate the SEM and related equipment to mount, image and analyze metallic and/or inorganic specimens with secondary electron imaging.
Operate the SEM and related equipment to mount, image and analyze metallic and/or inorganic specimens with backscattered electron imaging.
Operate the Energy Dispersive Spectrometer (EDS) and/or Wavelength Dispersive Spectrometer (WDS) to analyze the elemental composition of metallic and/or inorganic specimens.
Explore the principles and operation of electron optics.
Explore the electron beam/specimen interaction.
Demonstrate routine and preventative maintenance associated with daily operation of the SEM.
Interpret characteristic features of various fracture surface morphologies.
Investigate the principles of failure analysis as related to the study of materials science.
Demonstrate safety skills as related to high voltage, vacuum systems, X-radiation and gas cylinders.
Summarize data in standard laboratory report format.